Spectroscopic ellipsometry from 10 to 700 K

Abstract The temperature dependence of the optical constants materials (refractive index, absorption and extinction coefficients, dielectric function) can be determined with spectroscopic ellipsometry over a broad range temperatures photon energies or wavelengths. Such results have practical value, for example applications at cryogenic elevated temperatures. gaps their broadenings also provides insight into scattering electrons holes other quasiparticles, such as phonons magnons. This review presents detailed discussion experimental considerations temperature-dependent selected insulators, semiconductors, metals in infrared to ultraviolet spectral regions.